A Brief About Near Field Optics

A Brief About Near Field Optics

Combined NSOM/AFM systems functional in the field, apply with methodical applications – from natural to semiconductor, and from chemical substance to telecommunications.

Advanced systems for low temperatures NSOM/AFM; environmental chambers; chemical substance and gas delivery systems; and Nano-lithography systems are part of blended near-field optical microscopes.

Powerful imaging mixtures such as mixed AFM/NSOM/SEM and mixed AFM/NSOM/micro-Raman systems, allow researchers unique experimental set-ups for cutting-edge applications.

NSOM (SNOM) systems are for transmitting, collection and true representation. Systems both AFM and NSOM give a totally free optical axis from both above and below, thus enabling transparent SPM integration with standard optical microscopes both upright, inverted and unique dual (or 4pi) microscopes.

The award earning MultiView 1000(TM) is the first system available that totally integrates all kinds of scanned probe microscopy with regular optical microscopy. You can also buy Nikon microscope from online stores that provide superb images over the entire magnification range.

Designed around Nanonics’ trademarked, the award being successful 3D Flatscan(TM) scanning device technology and incorporating complex cantilevered optical fibers probes, the tool can merely and transparently be coupled with any inverted, upright, or dual optical microscope.

  • Simultaneous NSOM/AFM/Confocal Imaging
  • Normal Drive Sensing Start System Structures -Transmission, Representation, and Collection Modes
  • Modular and Customized Systems
  • Large 70 micron Z range
  • Integration with Complementary Techniques
  • Wide Selection of Scanning Probes
  • Electrical and Thermal Measurements

Normal Pressure Sensing

With cantilevered optical fiber probes, the MultiView 1000(TM) system eliminates a lot of the complexness associated with near-field imaging. Awkward shear-force techniques are something of days gone by as the normal-force sensing capacity for the probe makes suggestion approach identical compared to that used in normal atomic power microscopy. Large Z Check out Range

The top 70-micron x, y and z-range of the Nanonics 3D Flats can helps it be well suited for optical sectioning in confocal imaging. Found in this way, the MultiView 1000(TM) integrates regular far-field imaging, confocal microscopy, AFM, and near-field optics in one system.